Capture every chip, every cutter detail in minutes & get correct IADC dull grade
Bit dull grading made quick and easy. SnapScan is the most utilized, accurate and reliable cutter damage analysis system in the market. It supports 3 main aspects: agility, data capture, and forensics analysis. It is elegant in a phone interface, and it is very simple to use. Simple, easy, but powerful: let the machine learning algorithm analyze each PDC cutter and support the correct IADC dull grading generation while organizing your bit pictures.
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